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arxivquant-phcs.AIcs.LG2026-07-03

Self-Specializing Vision-Language Transmon Chip Calibration in a Physics-Grounded Environment

Animesh Tripathy, Aswanth Krishnan

Calibrating a superconducting transmon chip is a sequential decision problem under noise, drift, and a finite budget: an expert must choose experiments, read ambiguous plots, judge fit quality, and revise stale beliefs as the chip drifts. We study whether a vision-language agent can close this loop and specialize itself to one physical device without weight updates, via three co-designed artifacts. The first is a physics-grounded simulation environment for transmon chips: calibration observables derive from circuit-quantized parameters via scqubits, with realistic flux-line distortion, wall-time-scaled and mid-scan drift, and gate leakage, concerns a toy simulator would omit; each tool call advances a modeled clock so drift accrues by wall time, not call count. The second is a vision-language agent that runs the loop end to end, calling tools, reading plots, maintaining a structured notebook, and submitting parameters without hidden truth, scored against hidden parameters and gate fidelities measured on the device. The third is gradient-free online adaptation: a reflector reads truth-free anomaly signatures from past attempts and grows a small, human-readable device note appended to the prompt, admitted by a paired-snapshot accept gate that isolates strategy improvement from drift. On a hard-tier chip under budget pressure, six iterations raised the worst-case CZ fidelity from 0.678 to 0.787 and cut its variance, reproducing at four-qubit scale; a single accepted note raised CZ fidelity from 0.678 to 0.913 on its paired snapshot. A planted-fault study confirms the note is causal, diagnosing a hardware fault truth-free, its principal value raising the failure floor and cutting variance. The agent, scoring, and reward transfer to real hardware via a measurement-backend swap; only the accept gate is a simulation affordance, reducing to a held-out-slice or repeat-and-average form.

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